AXIOMET AX-18B Расширенная инструкция онлайн [10/19] 527859

The Meter's resistance ranges are 600.0Ω, 6.000kΩ, 60.00kΩ, 600.0kΩ, 6.000MΩ and 60.00MΩ.

To measure resistance:

1) Set the rotary switch to Ω

ΩΩ

Ω range.

2) Connect the black and red test leads to the COM and VΩ terminals respectively.

3) Connect the test leads to the circuit being measured and read the displayed value.

Some tips for measuring resistance:

The measured value of a resistor in a circuit is often different from the resistor's rated value.

This is because the Meter's test current flows through all possible paths between the probe tips.

In order to ensure the best accuracy in measurement of low resistance, short the test leads before

measurement and memory the test probe resistance in mind. This necessary to subtract for the

resistance of the test leads.

The resistance function can produce enough voltage to forward-bias silicon diode or transistor

junctions, causing them to conduct. To avoid this, do not use the 60MΩ range for in-circuit

resistance measurements.

On 60MΩ range, the meter may take a few seconds to stabilize reading. This is normal for high

resistance measuring.

When the input is not connected, i.e. at open circuit, the figure "OL" will be displayed for the

overrange condition.

3.2.3 Diode Test

To avoid electrical shock and/or damage to the instrument, disconnect circuit

power and discharge all high-voltage capacitors before testing diodes.

To test a diode out of a circuit

1) Set the rotary switch to Ω

ΩΩ

Ω range.

2) Press the SELECT key once to activate Diode Test.

3) Connect the black and red test leads to the COM and VΩ terminals respectively.

4) For forward-bias readings on any semiconductor component, place the red test lead on the

component's anode and place the black test lead on the component's cathode.

5) The meter will show the approx. forward voltage of the diode.

In a circuit, a good diode should still produce a forward bias reading of 0.5V to 0.8V; however,

the reverse-bias reading can vary depending on the resistance of other pathways between the

probe tips.